PDF Download Microwave Electronics: Measurement and Materials Characterization, by L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
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Microwave Electronics: Measurement and Materials Characterization, by L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
PDF Download Microwave Electronics: Measurement and Materials Characterization, by L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
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The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
- Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
- Examines every aspect of microwave material properties, circuit design and applications.
- Presents materials property characterisation methods along with a discussion of the underlying theory.
- Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
- Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
- Sales Rank: #2728387 in Books
- Published on: 2004-04-16
- Original language: English
- Number of items: 1
- Dimensions: 9.88" h x 1.46" w x 7.70" l, 2.92 pounds
- Binding: Hardcover
- 552 pages
From the Back Cover
The development of high speed, high frequency circuits and systems requires an understanding of the properties of materials functioning at the microwave level. This comprehensive reference sets out to address this requirement by providing guidance on the development of suitable measurement methodologies tailored for a variety of materials and application systems. Bringing together coverage of a broad range of techniques in one publication for the first time, this book:
- Provides a comprehensive introduction to microwave theory and microwave measurement techniques.
- Examines every aspect of microwave material properties, circuit design and applications.
- Presents materials property characterisation methods along with a discussion of the underlying theory.
- Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications.
- Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing and the physical sciences.
This book will appeal to practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. Senior students, researchers in microwave engineering and microelectronics and material scientists will also find this book a very useful reference.
Most helpful customer reviews
3 of 3 people found the following review helpful.
Great Book on Microwave NDT&E ...
By U. Hasar
Dear Candidate Buyers,
I am a Ph.D. student at the Department of Electrical and Computer Engineering in SUNY. I bought this book almost 2 months ago, and after buying from Amazon I used the book very often.
I am studying on Characterization of Dielectric Materials by a Microwave Non-Destructive method. The book is generally written good, but I do recommend this book to people studying and working on the special area of Characterization of Materials by Microwaves.
You can find in the literature lots of studies of the authors V. V. Varadan and V. K. Varadan, on characterization of materials by free-space non-destructive method. Their research group is one of the big scientic groups on Microwave NDT&E (Non-Destructive Testing and Evaluation).
As a result, I rate this book 5 out of 5, but want to notify the prospective buyers of this book that this book is written for a book on a specific subject (characterization of materials by microwaves), it is not a text book (in my opinion).
Bye
Ugur
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